Abstract: The purpose of this article is to share worked examples of skills profiling within the universal micro-credential framework, a novel approach designed to further the enablement of 21st ...

Abstract: Recognition of wafer map defect patterns is essential for evaluating the reliability of micro-electronic manufacturing. Due to the difficulty of labeling, the available large-scale wafer ...

A Python library for generating unique, distributed IDs using a modified Snowflake algorithm. This library allows for easy generation of Snowflake IDs, encoding/decoding to Base62, and extracting ...

Non-determinism and non-reproducibility present significant challenges in deep learning, leading to inconsistent results across runs and platforms. These issues stem from two origins: random number ...