For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...

The fundamental challenges of IC test have been the same for a long time. At the heart of all test strategies is controllability and observability. First, control the state of the chip with known test ...

Boundary scan has traditionally been difficult to promote as a product-design requirement. But boundary-scan success stories have percolated into the electronic-design community, and the availability ...