To ensure customers receive high-quality products, engineers must consider testing strategies before they even think about a schematic diagram. These days, most engineers realize boundary scan ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

When it comes to semiconductor device testing, the primary goal is to ensure that each device meets functional and performance specifications. Testing also plays a crucial role in confirming that ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

All QA professionals know the difference between a test script and a test case and the overlap between them, but few have the ...

Alex Ruiz follows up his popular JavaOne 2007 presentation with this introduction to test-driven GUI development with FEST. Learn what differentiates FEST (formerly TestNG-Abbot) from other GUI ...