The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...

Test compression offers the benefits of higher quality and lower test cost, but how do you choose the best methodology and tools for your current and future designs? Test compression evaluations ...

Test compression technology was invented to address the problem of escalating test-pattern size. Compression allows more test vectors to be applied to an IC in a shorter time and with fewer tester ...

Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the ...

Nanometer fabrication processes offer higher circuit density and better performance but also present new challenges. Systematic and random defects that were a nuisance above 90 nm are now killer ...

Large digital integrated circuits are becoming harder to test in a time- and cost-efficient manner. AI chips, in particular, have tiled architectures that are putting pressure on older testing ...