Parallel test is a surefire method for speeding up production, and asynchronous parallel test has long been known as an effective way of significantly improving through-put while making the most of ...

This is a preview. Log in through your library . Abstract This paper provides a means for testing the hypothesis that two simple regression lines are parallel, when ...

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...

Keithley has introduced its third-generation on-wafer RF measurement capability for semiconductor parametric production process control. New to Keithley's third-generation RF Option is the ability to ...

September 25, 2014. Keithley Instruments Inc. today announced it had received orders for additional S530 parametric test systems from X-FAB Silicon Foundries. X-FAB, a Germany-based foundry for analog ...

Taking a swipe at the cost of ownership, two additions to the Pyramid parametric probe card family allow single-pass DC and RF measurements, promising to reduce the cost of parametric production test ...

It is widely assumed that phenotypic traits can influence rates of speciation and extinction, and several statistical approaches have been used to test for correlations between character states and ...