ROTTERDAM, Netherlands, July 10, 2023 (GLOBE NEWSWIRE) -- Nearfield Instruments B.V., a provider of ground-breaking process control metrology solutions for advanced semiconductor devices, today ...

SINGAPORE, May 20, 2025 (GLOBE NEWSWIRE) -- Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have ...

SAN JOSE, Calif.--(BUSINESS WIRE)--Zeta Instruments, Inc., announced today that a leading Taiwan based outsourced semiconductor assembly and test (OSAT) ordered its third Zeta-580™ automated metrology ...

Vamsi Velidandla, VP of Marketing for Zeta Instruments, talks to AZoNano about the applications of their unique metrology technology. Tell us about Zeta Instruments and the type of products you ...

Enables complete metal inspection for all processes from chip wiring to advanced packaging on a single platform Rigaku Corporation, a global solution partner in X-ray analytical systems and a group ...

ROTTERDAM, The Netherlands, July 09, 2024 (GLOBE NEWSWIRE) -- Nearfield Instruments B.V., a provider of groundbreaking process control metrology solutions for advanced semiconductor devices, today ...

Metrology is a broad field that refers to the science of measurement, both theoretical and experimental, and its application in industrial settings is termed industrial metrology. Thus, industrial ...

The latest version of the LEXT confocal laser scanning microscope metrology instrument, the LEXT OLS4000 from Olympus, offers a number of additional features and enhanced functionality, such as ...

QUADRA is a high-throughput, in-line scanning probe metrology system with groundbreaking multi-miniaturized AFM head architecture to enable on-device, non-destructive three-dimensional (3D) metrology.

Zeta Instruments, Inc., announced today that a leading Taiwan based outsourced semiconductor assembly and test (OSAT) ordered its third Zeta-580™ automated metrology system for production monitoring ...