AMES, Iowa – Materials engineers don’t like to see line defects in functional materials. The structural flaws along a one-dimensional line of atoms generally degrades performance of electrical ...

Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.

In recent years, the development of quantum computers beyond the capability of classical computers has become a new frontier in science and technology and a key direction to realize quantum supremacy.

Boeing Co. has expanded inspections of newly produced 787 Dreamliners after finding a previously disclosed manufacturing defect in sections of the jet where it hadn’t been initially detected, ...

Boeing’s production cuts have sent shockwaves through the aviation industry, forcing suppliers to lay off thousands of employees. Tool Gauge reconfigured its operations just after opening a new ...

Researchers have discovered that engineering one-dimensional line defects into certain materials can increase their electrical performance. Materials engineers don't like to see line defects in ...

A new way to do full-wafer, in-line monitoring to identify missing vias in the back end of line. A viable in-line monitor for missing vias in the back end of line (BEOL) has traditionally been ...