AMES, Iowa – Materials engineers don’t like to see line defects in functional materials. The structural flaws along a one-dimensional line of atoms generally degrades performance of electrical ...

Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.

In groundbreaking materials research, a team led by University of Minnesota Professor K. Andre Mkhoyan has made a discovery that blends the best of two sought-after qualities for touchscreens and ...

In recent years, the development of quantum computers beyond the capability of classical computers has become a new frontier in science and technology and a key direction to realize quantum supremacy.

Short-lived topological defects in active liquid crystals can exhibit long-range, long-lived orientational order. Figure 1: Nematic superstructure of defects in an active liquid crystal of bundled ...

Maximized throughput is mandatory for film and sheet extruders, but greater speeds can mean greater opportunities for defects, necessitating inline inspection and thickness measurement. Many ...

A new way to do full-wafer, in-line monitoring to identify missing vias in the back end of line. A viable in-line monitor for missing vias in the back end of line (BEOL) has traditionally been ...

Researchers have discovered that engineering one-dimensional line defects into certain materials can increase their electrical performance. Materials engineers don't like to see line defects in ...