The world of nanoscale analysis has been revolutionized by the advent of electrical Atomic Force Microscopy (AFM) modes. New possibilities for measuring electrical properties with remarkable precision ...
Numerous measurement modes have been advanced to characterize mechanical, magnetic, electrical and thermal properties since Atomic Force Microscopy (AFM) was first developed [1]. Kelvin Probe Force ...
In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...
New hybrid nano-microscope by KRISS allows simultaneous measurement of optical and electrical properties. Expected to accelerate nano-scale research on advanced equipment and materials such as bilayer ...
Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure AFSEM is an atomic force microscope (AFM ...
(Nanowerk News) The Korea Research Institute of Standards and Science (KRISS) has developed a hybrid nano-microscope capable of simultaneously measuring various nanomaterial properties. This ...
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