There is an expectation from consumers that today’s electronic products will just work and that electronic manufacturers have continued to improve the quality of their products. In most cases, this ...
Scientists used Lorentz transmission electron microscopy (LTEM) to visualize topological defects. They were able to do so by passing electrons and observing their deflections through a thin magnetic ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
A technical paper titled “Accelerating Defect Predictions in Semiconductors Using Graph Neural Networks” was published by researchers at Purdue University, Indian Institute of Technology (IIT) Madras, ...
Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...
Advancements in nanotechnology fabrication and characterization tools have facilitated a number of developments in the creation of new two-dimensional (2D) materials and gaining and understanding of ...
• The underlying migration mechanism of Mg 2+ in cathode materials and roles of defects in Mg 2+ migration in cathode materials were studied. • Applications of defect engineering to Mg 2+ migration in ...
Results that may be inaccessible to you are currently showing.
Hide inaccessible results
Feedback