Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Learn how multi-scale insights from AFM and AFP enhance hybrid bond integrity and device performance.

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Researchers at Oak Ridge National Laboratory have used specialized tools to study materials at the atomic scale and analyze ...

An atomic force microscope tip writes data in stable ferroelectric structures, enabling reliable multistate storage at ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

Cecilia Van Cauwenberghe explains how to measure the future using nanoscale metrology and discusses the global competition ...

Some surfaces claim precision—but under an atomic force microscope, most don’t stand a chance. We scanned everything from ...

Explore the latest advancements in nanotechnology with this curated eBook on Atomic Force Microscopy (AFM). This essential collection highlights innovative applications of AFM across materials ...

How Estrogen Receptor Binds DNA. This illustration shows the estrogen receptor alpha (ERα, in orange) attaching to DNA (in blue) as a pair, or dimer. The image is based on real-time, high-speed atomic ...