Rapid developments in satellite and sensor technologies have increased the availability of high-resolution, remotely sensed images faster than researchers can process and analyze the data manually.

A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...

Large language models have captured the news cycle, but there are many other kinds of machine learning and deep learning with many different use cases. Amid all the hype and hysteria about ChatGPT, ...