Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...
An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...
What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...
This article introduces the FX200, the latest large-sample Atomic Force Microscope (AFM) from Park Systems, developed to meet both fundamental and advanced research requirements. The FX200 is ...
This article introduces Park Systems' latest large-sample atomic force microscope (AFM), the FX200—engineered to support both foundational studies and advanced research applications. Designed for ...
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